The weak points for the susceptibility to interference in modern electronics often lie in the circuits (ICs) of the assemblies. However, the increasing integration density and smaller semiconductor structures in the ICs also change their interference behavior. Fast and high-frequency interference, which was compensated for in ICs of older generations by the larger structures or did not become effective due to the high inductance of the longer interference current paths, is becoming increasingly relevant for new types of ICs. To test an IC for its susceptibility to interference from high-frequency signals, RF power can be fed directly into the pins in a conducted manner.
