EN/IEC 62132

EN/IEC 62132 RF Immunity Test Methods:

  • Radiated Immunity—TEM cell method. IEC 62132-2 defines a method of measuring an IC's immunity to radiated emissions. To test an IC using this method, you mount the DUT on the test board and install it in a mating port cut in the top or bottom of a TEM cell or GTEM cell. You must test the DUT in at least two orientations to ensure complete exposure to the generated electric field.
  • Conducted Immunity—Bulk Current Injection (BCI) method. IEC 62132-3 defines a method of evaluating immunity of the DUT to electromagnetic fields coupled to cables or cable bundles connected to the package pins. You can use this method to evaluate the immunity of IC pins connected to cables and also to evaluate other pins as well. The test signal is inductively coupled to the pin or pins under test using a current probe. Since you must connect the pins of the DUT to a cable or wire to inject the test signal, you can use a DUT application board or an IC EMC test board to perform this test.
  • Conducted Immunity—Direct RF Power Injection (DPI) method. IEC 62132-4 also defines a method of evaluating immunity of the DUT to electromagnetic fields coupled to cables or cable bundles connected to the package pins. When using this method, however, you directly inject the test signal using capacitive coupling to inject the signal on the cable or wire. The DUT can be mounted on either an IC EMC test board or an application board.
  • Conducted Immunity—Workbench Faraday Cage (WBFC) method. IEC 62132-5 defines a method for evaluating the immunity of an IC to signals injected at defined common-mode points. The DUT can be mounted on either an IC EMC test board or an application board, provided the board fits in the cage. With all input, output, and power connections to the test board filtered and connected to common-mode chokes, you must inject the conducted noise at PCB locations specified by the standard.
  • DPI (Direct Power Injection) (62132-4) widely used technique, especially in automotive applications.

The DPI test method is popular sice the DPI testing is very simple and straightforward to perform, and DPI testing can be easily simulated by chip designers using their standard design tools.

Turn Key Solution

Turnkey IEC 62132 Solution for DPI, BCI and other Test Methods.

The EMC Shop will provide complete turn-key solutions for compliance testing in accordance with EN/IEC 62132-X standards about 150 kHz to 1 GHz frequency range.

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EN/IEC 62132