IEC 61967
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APREL EM-ISight-4 Electromagnetic Scanning System
SKU: 41586
Langer EMV P603/P750 IC Test System Probe Set for RF Conducted Measurement
SKU: 30000
$1,285.00Lead Time 2-4 Weeks
IEC 61967-4:2021 specifies a method to measure the conducted electromagnetic emission (EME) of integrated circuits by direct radio frequency (RF) current measurement with a 1 Ω resistive probe and RF voltage measurement using a 150 Ω coupling network. These methods ensure a high degree of reproducibility and correlation of EME measurement results.
SKU: 41586
SKU: 30000