Overview
This R&S SMATE200A Dual Output RF Vector Signal Source is designed for RF production testing and wireless communication development and can be utilized for multi-tone radiated immunity testing according to IEC 61000-4-3/. Built on the proven SMU200A platform, the SMATE200A is optimized for fast signal switching and high throughput in automated test environments.
The instrument delivers reliable RF performance with flexible baseband capabilities, allowing users to generate complex test signals and perform high-speed production measurements. Its architecture supports rapid frequency and level adjustments, making it well suited for RF component testing, wireless device validation, and communication system development.
With connectivity options including LAN, GPIB, and USB, the SMATE200A can be easily integrated into automated test setups or laboratory environments. The platform is commonly used in RF production lines and engineering labs where stable signal generation and fast switching between test signals are required.
| Specification | Value |
|---|---|
| Frequency Range | 100 kHz to 3 GHz / 6 GHz |
| Setting Time | < 2 ms |
| Setting Time (List Mode) | < 400 µs |
| Output Level Range | −144 dBm to +13 dBm (PEP) +16 dBm in overrange |
| Range with High-Power Output Option | −144 dBm to +19 dBm (PEP) +26 dBm in overrange |
| Setting Time (≤3 GHz) | < 2 ms |
| Setting Time (>3 GHz) | < 4 ms |
| Harmonics (1 GHz) | |
| Carrier Offset >10 kHz | < −80 dBc |
| Carrier Offset >850 kHz | < −86 dBc |
| SSB Phase Noise (20 kHz carrier offset) | typ. −135 dBc typ. −140 dBc with low phase noise option |
| Wideband Noise (±5 MHz carrier offset) | typ. −153 dBc (CW) typ. −149 dBc (I/Q modulation) |
| ACLR Performance (3GPP FDD test model 1, 64 DPCHs) | typ. 70 dB |
| I/Q Bandwidth (RF) | Internal: 80 MHz External: 200 MHz |
| Memory Depth | 16 Msamples / 64 Msamples |
| Interfaces | IEEE 488.2, LAN (Gigabit Ethernet), 2 × USB, 1 × USB Slave, VGA |
