Overview
EM Test PFS 503N32 Description
Electronic and electrical equipment may be affected by voltage dips, short interruptions and voltage variations of the power supply. Dips and interruptions are caused by faults in the public supply network, in installations or by sudden large change of load. Testing to such phenomena is required to proof that electronic and electrical equipment do not fall into unsafe operation conditions. EM TEST offers a full range of simulators up to 3x690VAC, 100A and DC voltage capability of up to 600V
Benefits
The EM TEST PFS 503N Series represents a real three-phase Power Fail simulator. Not only phase-by-phase testing is possible but any combination of phases and all three phases can be simultaneously tested. Herefore the PFS503N Series is equipped with six individually controlled semiconductor switches. Each switch is electronically short-circuit protected.
Additionally the PFS 503N Series is available for nominal currents of up to 100A which is another outstanding and unreached feature for Power Fail testing. The PFS 503N Series offers BNC outputs for individual current monitoring for each phase by means of an oscilloscope. The inrush current can be measured using these BNC outputs. An analog DC signal of 0 to 10V is supplied to drive an external motorised three-phase variac. The PFS 503 can also be used for single phase testing offering a separate DUT output for this purpose.
Operation
Front panel menu and function keys enable the user to program his test routines quickly and accurately. The cursor allows fast control of all test parameters of the programmed routine, thus test procedures are simplified and confidence is generated that every step is carried out correctly.
IEC.CONTROL SOFTWARE FOR CONTROL AND DOCUMENTATION Outstanding user convenience, clearly structured windows and operation features and the EM TEST standards library along with the flexibility to generate user specific test sequences very easily are the main features of
Outstanding user convenience, clearly structured windows and operation features and the EM TEST standards library along with the flexibility to generate user specific test sequences very easily are the main features of iec.control software. The software is automatically configured according to the connected EM TEST generators. Extensive reporting capabilities help the user to create test reports that meet international requirements. iec.control is supported by Windows 2000, Windows XP, Windows Vista and Windows 7. Remote control is achieved either via USB or GPIB. iec.control supports a wide range of GPIB cards of National Instruments.
