Overview
Conducted Immunity/Susceptibility Test Setup
The Teseq NSG 3040A is an easy-to-use multifunction transient immunity generator that simulates electromagnetic interference effects for conformity testing with international, national and manufacturers’ standards including the latest IEC/EN standards. The NSG 3040A system is designed to fulfill conducted EMC test requirements for CE mark testing, which generally include combination wave surge, Electrical Fast Transient (EFT) pulses and Power Quality Testing (PQT). Extensive expansion capabilities enable the system to be configured for a much broader range of applications
Featuring an innovative, modular design, the NSG 3040A is a versatile system that can be configured for basic testing needs and expanded to meet the needs of sophisticated test laboratories.
Using state-of-the-art components, the self-contained modules set new standards with respect to switching and phase accuracy and exceed the existing standards’ requirements.
A 7” touch panel display with superb contrast and color makes controlling the NSG 3040A easy. For fast and efficient data entry, input devices include an integrated keyboard and a thumbwheel with additional keys for sensitivity adjustment. To achieve quick, reliable results in a development environment a standardized test can be initiated with just a few “clicks” using the integrated Test Assistance (TA) function.
Convenient touch input buttons make each parameter’s value highly visible and allow the user to quickly select and modify all settings. A stylus is not necessary, and ramp functions can be programmed quickly and easily. Multi-step test procedures can be created and their sequence or parameter values can be changed easily.
With expert mode users can make manual parameter changes using the thumbwheel while a test is under way, providing an effective and fast method for identifying critical threshold values.
The Teseq NSG 3040A has an Ethernet port for external PC control. The Windows-based control software simplifies test programming and compilation of complex test sequences with various types of tests. Test reports can be generated during the test operation, allowing the operator to enter observations as the test progresses and increasing the efficiency of long-term tests.
Teseq NSG 3040A Standards
- EMC Directives
- UN ECE R10 (Automotive)
- IEC/EN 61000-4-4
- IEC/EN 61000-4-5
- IEC/EN 61000-4-8
- IEC/EN 61000-4-9
- IEC/EN 61000-4-11
- IEC/EN 61000-4-29
- ANSI/IEEE C62.41
- EN 61000-6-1
- EN 61000-6-2
- EN 50370
- EN 61643
- EN 300386-2
- EN 300386 V1.3.2
- EN 301489-1
- EN 301489-7
- EN 301489-17
- EN 301489-24
- IEC 60255-1
- IEC 60601-1-2
- IEC 61326
- IEC 61850-3
- ITU-T K.12
- ITU-T K.20
- ITU-T K.21
- ITU-T K.28
- ITU-T K.41
- ITU-T K.44
- ITU-T K.45
