Teseq NSG 3060-ITU Transient Generator for Surge, Telecom, EFT/Burst, IEC and ITU-T.K

Teseq NSG 3060-ITU Transient Generator for Surge, Telecom, EFT/Burst, IEC and ITU-T.K

Condition:
Used
Test Capabilities:
Combination Wave Surge Immunity , EFT/Burst, Dips Interrupts & Variations
Standards Met:
IEC/EN 61000-4-4, IEC/EN 61000-4-5, IEC/EN 61000-4-11, IEC/EN 61000-4-29
Applications:
CE Marking, Medical Devices, Industrial Machinery, Electronics & IT
Max EUT AC Voltage (w/ Built in CDN):
264 Volts
Max EUT AC Current (w/ Built in CDN):
16 Amps
Max EUT DC Voltage (w/ Built in CDN):
220 Volts
Max EUT DC Current (w/ Built in CDN):
10 Amps
Peak inrush current capability:
500 A (at 230 V)
EFT/Burst Pulse Output Capability:
±200 V to 4.8 kV (in 1 V steps) - open circuit±100 V to 2.4 kV ±100 A to 2.2 kA
Combination/Wave Surge Output Capability:
±200 V to 4.4 kV (in 1 V steps)
Phase synchronization:
asynchronous, synchronous 0 to 359º (in 1º steps)
Burst (EFT) 5/50 ns:
Pulse conforms to IEC/EN 61000-4-4
Combination wave pulse 1, 2/50 - 8/20 μs (Hybrid-Surge pulse):
Pulse conforms to IEC/EN 61000-4-5
Telecom Surge:
As per FCC part 68, Pulse B, IEC 61000-4-5, ITU and ETSI recommendations
Manufacturer:
Teseq

 

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SKU:
10406

 

 

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Overview

Teseq NSG 3060-ITU Features:

Teseq’s NSG 3060-ITU generator is an easy-to-use multifunction generator that simulates electromagnetic interference effects for immunity testing in conformity with international, national and manufacturers’ standards including the latest IEC/EN standards. The NSG 3060-ITU system is designed to fulfill conducted EMC test requirements for CE mark testing, ANSI TIA 968B, and ITU T. K series, including Combination Wave Surge (6.6 kV), Telecom Surge 10/700 (7.7 kV), and Electrical Fast Transient (EFT) pulses.

Featuring an innovative modular design, the NSG 3060-ITU is a versatile system that can be configured for basic testing needs and expanded to meet the needs of sophisticated test laboratories. Teseq’s well proven “Master-Slave” architecture enables individual pulse modules to be calibrated separately, with calibration data and correction factors stored on the slave controller. New modules can be easily installed with no need to return the entire system for calibration.

Teseq NSG 3060-ITK Standards Met:

Key Considerations

Manufacturer:
Teseq
Test Capabilities:
Combination Wave Surge Immunity , EFT/Burst, Dips Interrupts & Variations
Standards Met:
IEC/EN 61000-4-4, IEC/EN 61000-4-5, IEC/EN 61000-4-11, IEC/EN 61000-4-29
Applications:
CE Marking, Medical Devices, Industrial Machinery, Electronics & IT
Max EUT AC Voltage (w/ Built in CDN):
264 Volts
Max EUT AC Current (w/ Built in CDN):
16 Amps
Max EUT DC Voltage (w/ Built in CDN):
220 Volts
Max EUT DC Current (w/ Built in CDN):
10 Amps
Peak inrush current capability:
500 A (at 230 V)
EFT/Burst Pulse Output Capability:
±200 V to 4.8 kV (in 1 V steps) - open circuit±100 V to 2.4 kV ±100 A to 2.2 kA
Combination/Wave Surge Output Capability:
±200 V to 4.4 kV (in 1 V steps)
Phase synchronization:
asynchronous, synchronous 0 to 359º (in 1º steps)
Burst (EFT) 5/50 ns:
Pulse conforms to IEC/EN 61000-4-4
Combination wave pulse 1, 2/50 - 8/20 μs (Hybrid-Surge pulse):
Pulse conforms to IEC/EN 61000-4-5
Telecom Surge:
As per FCC part 68, Pulse B, IEC 61000-4-5, ITU and ETSI recommendations

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SKU: 10347

Coupling: 260 V ac 50/60 Hz 16 A
Peak inrush current capability: 500 A Peak
Pulse amplitude: Adjustable voltage range: 250 V to 4400 V Voltage amplitude into 50 Ohms: 125 V to 2000 V (± 10%) Voltage amplitude into 1000 Ohms: 250 V to 4000 V (± 20%)
Pulse current (short circuit): 125 A to 2000 A
Standards Met: IEC 61000-4-4, 61000-4-5, 61000-4-11, 61000-4-29
Was:
$19,500.00
$15,900.00
IN STOCK