Overview
EM-ISight-4 Electromagnetic Scanning System Single Probe Solution 9kHz – 6GHz
EM-ISight is the first fully flexible EMI/EMC measurement system built on 5 or 6 axis articulated robots designed to support multiple applications and industries including networking, automotive, integrated circuits, aviation, military, and consumer products. Used as a compliance system for IEC-61967-1-6 or a pre-compliance / development tool, the abundance of features meet most requirements for research, design and analytical needs. Custom applications can be developed by the user for EM-ISight allowing for a complete customized test platform. The footprint of the system means that it can be introduced to most measurement environments with multiple frequency range and robot sizes to choose from. The system can be housed in the optional mobile shield, and has an assessed noise floor (sensitivity) of below -139 dBm* when used with high end spectrum analyzers.
EM-ISight is an affordable and easy to use system with great return on investment when using the Far Field Approximation (FFA) module. It is a true alternative to costly pre-compliance EMC chambers which have high maintenance costs and use significant floor space. Integration of high end Low Noise Amplifiers at the core of the transmission line yield low insertion loss and high unwanted field rejection of better than 25dBm. Easy setup for measurement profiles (less than 60 seconds) using the optional camera and touch detection allow complex topologies of a PCB to be taught in real time.
Integration of 6 axis robots allows for measurements in traditional Cartesian or advanced Horizontal plains. Users can utilize a measurement frequency span of 10 kHz to 6 GHz using our proprietary single probe solution.
Applicable Standards IEC-61967-1-6 VCCI/CISPR 22/FCC Pt 15/22 EN55022 CISPR 12/FCC Pt 18/EN55011/ EN60555/VDE0871 EN55024/EN6100-6-4/GR-1089-CORE ITU-T/ETS300/ IEC-6100-3 | Applications Integrated Circuit/Printed Circuit Board Wireless modules De-Sense testing (receiver circuits) Medical devices Automotive and aviation Electronic device emissions Pre-Compliance testing (emissions/susceptibility) Quality control/audit Consumer products cell phone/computer devices Susceptibility / ESD |
Supported Spectrum Analyzers Tektronix |
NOTE: Signal generator, spectrum analyzer is customer supplied.
Some applications require additional upgrades from a standard package spectrum analyzer; please confirm spectrum analyzer compatibility with APREL.
FFA Tiled Volumes with Hotspot Markers | 4D Plot with Interpolated Grid and 3D Hotspot Marker |
System Highlights
- Single probe solution from 10kHz to 6GHz
- X/Y/Z scan areas of 300/600/1,000 mm dependent on system
- High resolution scan (>0.02mm)
- Coarse scan with dynamic peak search function
- Real-time topology analysis using dynamic touch detection
- Z height distance from 0.05mm up to 300/600/1,000mm dependent on system
- 4D Measurements of DUT by integrating X/Y/Z & Phi
- Field distribution presented in 2D, 3D or 4D plotting with quick snap image processing @ 2.2µm
- Source direction plots (vector)
- Customizable reports based on user requirements automatically exported to MS Word
- Delta plot measurement function (compare before/after measurements)
- Frequency distribution plots based on span and trace with added limit lines
- AVI export function for real-time visualization of field and frequency distribution
- Advanced measurement functions, single point analysis, quick check, free move and point delta
- Micro Strip Line 9kHz to 6GHz
- Quick scan setup using Optional robot mounted vision camera with 2.2µm pixel size and auto zoom
Standard System Configuration
- Single probe solution for measurements from 10kHz to 6GHz
- Low Noise Amplifier 9kHz – 6GHz
- Calibrated H-Field antenna probe to ISO/IEC-17025 standards to IEC-61967-1-6
- Software platform with 1 year fully comprehensive support and feature updates
- Software supports user defined parametric settings, user defined pass/fail graphing, and graphical measurement data for statistical readout full 3/4D graphic package for visualization and manipulation of measured fields, storage and retrieval of measurement results
- Automated precision antenna probe movement using DENSO robotics
- Remote access to measurement database
- Dynamic process control
- Z-Axis surface detection system
- Collision detection system
- Device Positioning fixture
Custom mobile shields available for purchase with EM-ISight Systems
Optional Accessories/Software
- Measurement software and probe upgrade to 20/ 40GHz
- Mobile Shield for isolation of ambient sources (-145dBm >700MHz)
- E-Field Antenna Probe
- Dual Stage Low Noise Amplifiers DC to 6 GHz
- FFA Far Field Approximation Software
- USA Ubiquitous Server Application
- Robot mounted vision camera with 2.2µm pixel size and auto zoom
- ESD/Susceptibility Test Suite (available winter 2015)
Description | Perform EM Near-field scanning on a PCB, IC, LCD, RFID tag, wireless module, or antenna’s for quality control and design optimization, pre-test and certification | ||||||||||||||||||||||||||||
Software | Windows XP, Vista, 7, 8 and MAC Boot Camp User friendly GUI that allows for easy setup and data retrieval Automatic antenna probe movement control Automatic system control or user definable parametric setup incorporating optional vision camera Visual display including storage and retrieval of measured results in full 3/4D Data tracking for project improvement/quality control Importation of previous measurement profiles to track design/quality improvements | ||||||||||||||||||||||||||||
Applications | Perform EM Test - measurements of (near-field) magnetic fields emitted by a DUT, including RF circuit, PCB and IC EM field values measured using an optional spectrum analyzer and presented in 2D/3D/4D form via PC Typical applications include, EMI noise emission analysis Shielding placement/optimization PCB board or IC design optimization/placement Antenna design optimization RF-Immunity/emitted radiation analysis of mobile handset LCD or LCD controllers Optional Susceptibility and ESD test modules | ||||||||||||||||||||||||||||
Typical Probe Measuring Unit |
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Measuring Reach and Movement |
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DUT Orientation |
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System Control |
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General |
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Additional Features SW | Multiple plots recorded in single report Multiple layers on single measurement process Automated peak search Dynamic touch detection User defined plotting Limit exceed search function User defined limit function Automated data summary reporting AVI plotting over device or in 3/4D mode Remote access for database data retrieval Multiple driver support for Anritsu, Agilent and Rhode & Schwarz Spectrum Analyzers |
*Customer must specify at time of order (standard build is 110V)
6 Axis systems require 220V
Supported Spectrum Analyzer Models | |||
STANDARD 450mm | EXTENDED REACH 850mm | LONG REACH 1.2m | |
5 Axis | ? | ||
6 Axis | ? | ? | ? |
6 GHz | ? | ? | ? |
20 GHz | ? | ? | ? |
40 GHz | ? | ? | ? |
FFA | ? | ? | ? |
USA | ? | ? | ? |
Vertical Scanning * | ? | ? | ? |
*For 6 axis model only. |