Langer EMV P603/P750 IC Test System Probe Set for RF Conducted Measurement

The EMC Shop is an ISO 17025 accredited calibration company with the Langer EMV P603/P750 IC Test System Probe Set in stock available for sale or rental. Repair and refurbishment services available as well. Contact us now for application support.

The Langer EMV P603/P750 IC Test System Probe Set is used to measure conducted emissions (measurements with direct 1 Ohm/150 Ohm-coupling) at IC pins. For the current and voltage measurement there is one respective probe available. Every Test-IC pin can be reached and contacted by the probe.

The measurements with the probe set guarantee a high precision when repeated and comparability of measurements. The ICE1 IC test environment of Langer EMV-Technik is used to start the test IC. measurements can be done with ChipScan-ESA software. Measurement results of all measured pins are saved in the software and can be compared fast and systematically.

The P603 is a 1 ohm probe for direct measurement of high frequency (RF) current at IC pins. It is used to measure at supply pins (Vdd / Vss) and signal pins. The 1 ohm RF current probe has a pin contact with which IC pins can be separately contacted and measured.

The P750 RF voltage probe corresponds to a 150 ohm coupling network according to IEC 61967-4 for the RF voltage measurement at IC pins. The P750 probe has of a high resistance, capacitive coupled input. RF voltages can be measured at different pins of the device under test.